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00635nam a2200193 a 4500 |
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923450 |
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20171111231359.0 |
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040712s2000 xu er 000 0 eng d |
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|a 0871706881
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040 |
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|a TEIK
|b gre
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082 |
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0 |
|a 669.95
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100 |
1 |
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|a Friel, John J.
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245 |
1 |
0 |
|a Practical Guide to Image Analysis/
|c John J. Friel
|
260 |
|
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|a Materials Park,Ohio:
|b ASM International,
|c c 2000
|
300 |
|
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|a 290σ. ;
|c 21εκ.
|
504 |
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|a Περιέχει βιβλιογραφίας και ευρετήριο
|
650 |
1 |
0 |
|a Image analysis
|
650 |
1 |
0 |
|a Metallography
|
952 |
|
|
|a GRThAnMak
|b 59cc95916c5ad13446002df9
|c 998a
|d 945l
|e 669.95 PRA
|t 1
|x m
|z Books
|