Properties of amorphous silicon and its alloys/

Main Author: Searle, Tim
Format: Book
Language:English
Published: London: IEE, INSPEC, 1998
Series:EMIS Datareviews Series 19
Subjects:
Physical Description:412σ. : εικ. ; 29εκ.
Bibliography:Περιέχει βιβλιογραφία και ευρετήριο
ISBN:0852969228