Advances and applications in the metallography and characterization of materials and microelectronic components :proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society /
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| Format: | Book |
| Language: | English |
| Published: |
Columbus, Ohio :
International Metallographic Society ;
c1996 .
Materials Park, Ohio : ASM International , |
| Subjects: |
| Βιβλιοθήκη | Ταξιθετικός αριθμός | Αριθμός Αντιτύπων | Πληροφορίες | Κατάσταση |
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| ΤΕΙ Αθήνας | - | 1 | Προβολή | OPAC |