Standards for electronic imaging technologies, devices, and systems :proceedings of a conference held 1-2 February 1996, San Jose, California /

Corporate Authors: IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors: Nier, Michael
Format: Book
Language:English
Published: Bellingham, Wash : SPIE Optical Engineering Press , c1996 .
Subjects:
ΒιβλιοθήκηΤαξιθετικός αριθμόςΑριθμός ΑντιτύπωνΠληροφορίεςΚατάσταση
ΤΕΙ Αθήνας-1ΠροβολήOPAC