Physical aspects of electron microscopy and microbeam analysis/
| Corporate Authors: | , , |
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| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
New York:
Wiley,
c1975
|
| Subjects: |
| Item Description: | "Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973"--Πρόλ. |
|---|---|
| Physical Description: | xiii, 474 σ. : εικ. ; 26 εκ. |
| Bibliography: | Περιέχει βιβλιογραφικές παραπομπές και ευρετήριο |
| ISBN: | 0471790206 |