Characterization of particles : proceedings of the particle analysis session of the 13th annual conference of the Microbeam Analysis Society held at Ann Arbor, Michigan, June 22, 1978 /
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Washington, D.C. :
U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
[1980]
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| Series: | National Bureau of Standards special publication ;
533 |
| Subjects: |
| Βιβλιοθήκη | Ταξιθετικός αριθμός | Αριθμός Αντιτύπων | Πληροφορίες | Κατάσταση |
|---|---|---|---|---|
| Εθνικό Μετσόβιο Πολυτεχνείο | 620.43 MIC | 1 | Προβολή | OPAC |