Characterization methods for submicron MOSFETs/
| Corporate Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Boston:
Kluwer Academic Publishers,
c1995
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| Series: | Kluwer international series in engineering and computer science
SECS 352. Analog circuits and signal processing |
| Subjects: |
| Βιβλιοθήκη | Ταξιθετικός αριθμός | Αριθμός Αντιτύπων | Πληροφορίες | Κατάσταση |
|---|---|---|---|---|
| Δημοκρίτειο Πανεπιστήμιο Θράκης | TK 7871 .95 | 1 | Προβολή | OPAC |