Applied goodness of fit testing/

Main Author: Phillips, Don T.
Corporate Author: American Institute of Industrial Engineers
Format: Book
Language:English
Published: Atlanta, Ga.: American Institute of Industrial Engineers, c1972
Series:OR monograph series no. 1
Subjects:
Physical Description:71 σ. : εικ. ; 28 εκ.
Bibliography:Βιβλιογραφία: σ. 70-71