Semiconductor devices, measurements and tests/
| Main Author: | |
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| Corporate Author: | |
| Format: | Book |
| Language: | English Russian |
| Published: |
Moscow:
Mir,
1980
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| Subjects: |
| Item Description: | "Revised from the 1978 Russian third edition"--Verso σ.τ. |
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| Physical Description: | 207, [1] σ. : εικ. ; 21 εκ. |
| Bibliography: | Βιβλιογραφία: σ. [208] |