Takeda, E., Yang, C. Y., & Miura-Hamada, A. (1995). Hot-carrier effects in MOS devices. San Diego: Academic Press.
Chicago Style CitationTakeda, Eiji, Cary Y. Yang, and Akemi Miura-Hamada. Hot-carrier Effects in MOS Devices. San Diego: Academic Press, 1995.
MLA CitationTakeda, Eiji, Cary Y. Yang, and Akemi Miura-Hamada. Hot-carrier Effects in MOS Devices. San Diego: Academic Press, 1995.
Warning: These citations may not always be 100% accurate.