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Advances in x-ray analysis /
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Advances in x-ray analysis /
Corporate Author:
Annual Denver Conference on Applications of X-Ray Analysis (Proceedings)
Other Authors:
Barrett, Charles S.
Format:
Book
Published:
New York:
Plenum Press,
c1990
Subjects:
X-rays
>
Industrial applications
Holdings
Description
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621.3616 ADV
1
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OPAC
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