Applied survival analysis : regression modeling of time to eventdata /

Main Author: Hosmer, David W.
Other Authors: Lemeshow, Stanley
Format: Book
Language:English
Published: New York : Wiley, c1999.
Subjects:
Item Description:"A Wiley-Interscience publication."
Physical Description:xiii, 386 p. : ill. ; 25 cm.
Bibliography:Includes bibliographical references (p. 365-377) and index.
ISBN:0471154105