World class reliability : using Multiple Environment Overstress Tests to make it happen /

Main Author: Bhote, Keki R., 1925-2013.
Other Authors: Bhote, Adi K.
Format: Book
Language:English
Published: New York : American Management Association, ©2004.
Subjects:
Online Access:http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=109482
Physical Description:1 online resource (xix, 218 pages) : illustrations
Bibliography:Includes bibliographical references (pages 209-210) and index.
ISBN:0814427995
9780814427996
0814407927
9780814407929