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20171111234657.0 |
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010219s1999 enka ob 101 0 eng d |
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|a 0585347042
|q (electronic bk.)
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|a 9780585347042
|q (electronic bk.)
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|a N$T
|b eng
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|a QH212.E4
|b E3798 1999eb
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|a Electron microscopy and analysis 1999 :
|b proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Sheffield, 24-27 August 1999 /
|c edited by C.J. Kiely.
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|a Bristol ;
|b Institute of Physics Pub.,
|c ©1999.
|a Philadelphia :
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300 |
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|a 1 online resource (xvii, 632 pages) :
|b illustrations.
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|a Institute of Physics conference series ;
|v no. 161
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|a Includes bibliographical references and indexes.
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650 |
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|a Electron microscopy
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650 |
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|a SCIENCE
|x Electron Microscopes & Microscopy.
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700 |
1 |
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|a Kiely, C. J.
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2 |
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|a Institute of Physics (Great Britain).
|b Electron Microscopy and Analysis Group.
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|u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=27512
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|b 5a0462066c5ad14ac1ee6820
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