Electromigration in ULSI interconnections
| Main Author: | |
|---|---|
| Corporate Author: | |
| Format: | Book |
| Language: | English |
| Published: |
Hackensack, N.J. :
World Scientific,
c2010.
|
| Series: | International series on advances in solid state electronics and technology (ASSET)
|
| Subjects: | |
| Online Access: | http://site.ebrary.com/lib/ucy/Doc?id=10480052 |
Internet
http://site.ebrary.com/lib/ucy/Doc?id=10480052| Βιβλιοθήκη | Ταξιθετικός αριθμός | Αριθμός Αντιτύπων | Πληροφορίες | Κατάσταση |
|---|---|---|---|---|
| Πανεπιστήμιο Κύπρου - Ανοιχτό Πανεπιστήμιο Κύπρου | - | 1 | Προβολή | OPAC |