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01067nam a2200217 a 4500 |
| 001 |
1797023 |
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20171111234543.0 |
| 008 |
100115s2010 dcud s 001 0 eng d |
| 020 |
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|z 9781607504900 (hardcover)
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| 040 |
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|a CaPaEBR
|z 9781607504917 (e-book)
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| 050 |
1 |
4 |
|a QC173.4.I57
|b R47 2010eb
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| 111 |
2 |
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|a Research Symposium on Characterization and Behavior of Interfaces
|c Atlanta, Ga.)
|d (21 September 2008 :
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| 245 |
1 |
0 |
|a Characterization and behavior of interfaces
|b proceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA /
|c [edited by] J. David Frost.
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| 260 |
|
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|a Washington, D.C. :
|b IOS Press,
|c 2010.
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| 300 |
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|a x, 155 p. :
|b ill.
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| 500 |
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|a Includes index.
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| 650 |
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0 |
|a Interfaces (Physical sciences)
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| 700 |
1 |
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|a Frost, J. David.
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| 710 |
2 |
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|a Georgia Institute of Technology.
|b School of Civil and Environmental Engineering (Atlanta, Ga., U.S.A.)
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| 856 |
4 |
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|a ebrary, Inc.
|u http://site.ebrary.com/lib/ucy/Doc?id=10403973
|
| 952 |
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|a CY-NiOUC
|b 5a0459026c5ad14ac1ed25dc
|c 998a
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