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00854nam a2200217 a 4500 |
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1796537 |
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20171111234543.0 |
| 008 |
120813s2012 ts a sb 001 0 eng d |
| 020 |
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|z 9781608053599
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|a CaPaEBR
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| 050 |
1 |
4 |
|a TK7871.85
|b .W65 2012eb
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| 100 |
1 |
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|a Wong, Terence K. S.
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| 245 |
1 |
0 |
|a Semiconductor strain metrology
|b principles and applications /
|c Terence K.S. Wong.
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| 260 |
|
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|a [Saif Zone, Sharjah, U.A.E] ;
|b Bentham Science,
|c [2012]
|a Oak Park, IL :
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| 300 |
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|a 136 p. :
|b ill.
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| 504 |
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|a Includes bibliographical references and index.
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| 650 |
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0 |
|a Semiconductors
|x Design and construction
|x Materials.
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| 650 |
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0 |
|a Compound semiconductors
|x Design and construction
|x Materials.
|
| 710 |
2 |
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|a ebrary, Inc.
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| 856 |
4 |
0 |
|u http://site.ebrary.com/lib/ucy/Doc?id=10570978
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| 952 |
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|a CY-NiOUC
|b 5a0458f16c5ad14ac1ed23e3
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
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