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00867nam a2200229 a 4500 |
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20171111234524.0 |
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081027s2009 si a sb 001 0 eng d |
| 020 |
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|z 9780470824078 (cloth)
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| 040 |
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|a CaPaEBR
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| 050 |
1 |
4 |
|a TK7871.99.M44
|b K47 2009eb
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| 100 |
1 |
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|a Ker, Ming-Dou.
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| 245 |
1 |
0 |
|a Transient-induced latchup in CMOS integrated circuits
|c Ming-Dou Ker and Sheng-Fu Hsu.
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| 260 |
|
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|a Singapore ;
|b Wiley,
|c c2009.
|a Hoboken, NJ :
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| 300 |
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|a xiii, 249 p. :
|b ill.
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| 504 |
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|a Includes bibliographical references and index.
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| 650 |
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0 |
|a Metal oxide semiconductors, Complementary
|x Defects.
|
| 650 |
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0 |
|a Metal oxide semiconductors, Complementary
|x Reliability.
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| 700 |
1 |
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|a Hsu, Sheng-Fu.
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| 710 |
2 |
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|a ebrary, Inc.
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| 856 |
4 |
0 |
|u http://site.ebrary.com/lib/ucy/Doc?id=10325826
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| 952 |
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|a CY-NiOUC
|b 5a0456156c5ad14ac1ecce08
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
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