IEEE Semiconductor Thermal Measurement and Management Symposium

Format: Book
Language:English
Published: New York: IEEE, 1991-
Subjects:
Online Access:http://ieeexplore.ieee.org/Xplore/conferences.jsp
LEADER 00799nam a2200217 a 4500
001 1549338
005 20171111233637.0
008 070716c19919999xu da er 000 b eng d
022 |a 10652221 
040 |a ASTSFA 
040 |a CY  |b University of Cyprus  |e AACR-2 
050 |a TK7871.85.S4 
240 1 0 |a Annual IEEE Semiconductor Thermal Measurement and Management Symposium 
245 1 0 |a IEEE Semiconductor Thermal Measurement and Management Symposium 
246 1 3 |a Annual IEEE Semiconductor Thermal Measurement and Management Symposium 
260 |a New York:  |b IEEE,  |c 1991- 
650 0 |a Technology 
650 0 |a Semiconductors 
650 0 |a Integrated circuits  |x Congresses 
856 4 0 |u http://ieeexplore.ieee.org/Xplore/conferences.jsp 
952 |a CY-NiOUC  |b 5a0431216c5ad14ac1e8d067  |c 998a  |d 945l  |e -  |t 1  |x m  |z Books