Atomic force microscopy / scanning tunneling microscopy 2 ; Samuel H. Cohen, Marcia L. Lightbody

Other Authors: Cohen, Samuel H, Lightbody, Marcia L
Format: Book
Language:English
Published: London: Plenum Press, c 1997
Subjects:
Item Description:Proceedings of the Second U. S. Army Soldier Systems Command, Natick Research, Developement and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 - 9, 1994, in Natick, Massachusetts
Physical Description:ix, 250 p. : diagr., plat. ; 26 cm.
Bibliography:Includes bibliographical references and index
ISBN:030645596X