Description: Modern mental measurement :

Main Author:	Linden, Kathryn W.
Other Authors:	Linden, James D.
Format:	Book
Language:	English
Published:	Boston : Houghton Mifflin, [1968]
Series:	Guidance monograph series. Series III : testing
Subjects:	Intelligence tests Psychometrics Educational tests and measurements Τέστ νοημοσύνης Ψυχομετρική

Physical Description:	ix, 114 p. ; 23 cm.
Bibliography:	Includes bibliography (p. 93-111) and index