Cover Image

Metrologie appliquee : methodes et instruments de mesures /

Main Author: Denis-Papin, Maurice, 1900-
Other Authors: Vallot, Jacques
Format: Book
Language:French
Published: Paris: Dunod, 1954
Edition:2eme
Subjects:
Physical measurements
Physical Description:xxxvi, 235, xlvi p. : ill., tab., diagrs. ; 15 cm.
Bibliography:Includes index

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