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20171111231316.0 |
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980127s gr gr 00010 eng d |
| 020 |
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|a 0824701828
|z (alk. paper)
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| 050 |
1 |
4 |
|a TK7874
|b .D365 1998
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| 082 |
0 |
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|2 21
|a 621.3815
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| 100 |
1 |
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|a David, Ren ,
|d 1939-
|
| 245 |
1 |
0 |
|a Random testing of digital circuits :theory & application /
|c Ren David ;in cooperation with Mireille Jacomino and Pascale Thevenod ;with a foreword by Thomas W. Williams
|
| 260 |
|
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|a New York :
|b Marcel Dekker ,
|c c1998 .
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| 300 |
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|a p. cm.
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| 504 |
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|a Includes bibliographical references and index.
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| 650 |
1 |
0 |
|a Digital integrated circuits
|x Testing
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| 952 |
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|a GR-AtTEI
|b 59cc7d996c5ad13446fcff62
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
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