New horizons in testing : latent trait test theory and computerized adaptive testing /

Corporate Authors: United States. Office of Naval Research, Computerized Adaptive Testing Conference
Other Authors: Weiss, David J., Bock, R. Darrell.
Format: Book
Language:English
Published: New York : Academic Press, 1983.
Subjects:
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020 |a 0127427805 (alk. paper) 
040 |a DLC 
050 |a BF176  |b .N48 1983 
082 |2 19  |a 153.9/3 
245 |a New horizons in testing :  |b latent trait test theory and computerized adaptive testing /  |c edited by David J. Weiss ; contributors, R. Darrell Bock ... [et al.]. 
260 |a New York :  |b Academic Press,  |c 1983. 
300 |a xvii, 345 p. :  |b ill. ;  |c 24 cm. 
500 |a Derived from the 1979 Computerized Adaptive Testing Conference held at Wayzata, Minn., sponsored by the U.S. Office of Naval Research, et al. 
504 |a Includes bibliographical references and indexes. 
650 |a Psychological tests 
650 |a Computer adaptive testing 
700 1 |a Weiss, David J. 
700 1 |a Bock, R. Darrell. 
710 1 |a United States.  |b Office of Naval Research 
711 2 |a Computerized Adaptive Testing Conference  |c Wayzata, Minn.)  |d (1979 : 
952 |a GrThPMO  |b 59affca66c5ad17d7e5a6893  |c 952a  |d 9528  |e -  |t 1  |x m  |z Books