New horizons in testing : latent trait test theory and computerized adaptive testing /

Corporate Authors: United States. Office of Naval Research, Computerized Adaptive Testing Conference
Other Authors: Weiss, David J., Bock, R. Darrell.
Format: Book
Language:English
Published: New York : Academic Press, 1983.
Subjects:
Item Description:Derived from the 1979 Computerized Adaptive Testing Conference held at Wayzata, Minn., sponsored by the U.S. Office of Naval Research, et al.
Physical Description:xvii, 345 p. : ill. ; 24 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:0127427805 (alk. paper)