APA Citation

Beenker, F. P. M., Bennetts, R. G., & Thijssen, A. P. (1995). Testability concepts for digital ICs: The macro test approach. Dordrecht ; Boston: Kluwer Academic Publishers.

Chicago Style Citation

Beenker, F. P. M., R. G. Bennetts, and A. P. Thijssen. Testability Concepts for Digital ICs: The Macro Test Approach. Dordrecht ; Boston: Kluwer Academic Publishers, 1995.

MLA Citation

Beenker, F. P. M., R. G. Bennetts, and A. P. Thijssen. Testability Concepts for Digital ICs: The Macro Test Approach. Dordrecht ; Boston: Kluwer Academic Publishers, 1995.

Warning: These citations may not always be 100% accurate.