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00757nam a2200205 a 4500 |
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20171111234616.0 |
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110712s2010 njuad sb 001 0 eng d |
| 020 |
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|z 981427710X
|z 9789814277105
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| 040 |
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|a CaPaEBR
|z 9789814277112 (e-book)
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| 050 |
1 |
4 |
|a QC611.8.C64
|b J64 2010eb
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| 100 |
1 |
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|a Johnston, Allan.
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| 245 |
1 |
0 |
|a Reliability and radiation effects in compound semiconductors
|c Allan Johnston.
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| 260 |
|
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|a Hackensack, N.J. :
|b World Scientific,
|c 2010.
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| 300 |
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|a xii, 363 p. :
|b ill.
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| 504 |
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|a Includes bibliographical references and index.
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| 650 |
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0 |
|a Compound semiconductors.
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| 710 |
2 |
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|a ebrary, Inc.
|
| 856 |
4 |
0 |
|u http://site.ebrary.com/lib/ucy/Doc?id=10479993
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| 952 |
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|a CY-NiOUC
|b 5a045ddd6c5ad14ac1edb6e5
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
|
