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ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /

Corporate Authors: International Symposium for Testing and Failure Analysis Phoenix, Ariz.), ASM International., Electronic Device Failure Analysis Society.
Format: Book
Language:English
Published: Conference proceedings from the 28th International Symposium for Testing and Failure Analysis Materials Park, OH : ASM International, 2002.
Subjects:
Electronics > Materials > Testing
Electronic apparatus and appliances > Testing
Online Access:http://site.ebrary.com/lib/ucy/Doc?id=10320302
Physical Description:xxiv, 789 p. : ill.
Bibliography:Includes bibliographical references and index.

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